In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today the release of the new Vero VRS1250 Atomic Force Microscope (AFM), which enables video-rate imaging with line ...