DUBLIN--(BUSINESS WIRE)--The "Global Automated Test Equipment Market Size, Market Share, Application Analysis, Regional Outlook, Growth Trends, Key Players, Competitive Strategies and Forecasts, ...

Charles R. Goulding and Nimra Shakoor show how companies like Teradyne are removing bottlenecks and keeping pace with rising AI chip complexity.

GRENOBLE, France--(BUSINESS WIRE)--Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, today announced the first industry turnkey testing equipment dedicated to 3D ...

The ATE system addresses the crucial step of chip sorting for the new generation of magnetic sensors tested at wafer-level, under high field intensity, and on a large area coverage. Hprobe, a provider ...

Device power supply (DPS) ICs have flexible force voltage and force current capacities to provide dynamic test capabilities to automated test equipment (ATE). The DPS IC is a voltage source when the ...

The complexity of electronic-device testing varies widely, ranging from the simplest type—manual testing—to the most complex—large-scale automatic test equipment (ATE). In between simple manual ...

An 8 Gbps high-speed relay MMIC for an Automated Test Equipment (ATE) using a gallium nitride is developed and evaluated. Metal-Insulator-Semiconductor structure with a tantalum oxynitride is employed ...

SAN FRANCISCO, March 16, 2020 /PRNewswire/ -- The global automated test equipment market size is estimated to reach USD 8.68 billion by 2027, expanding at a CAGR of 3.4% over the forecast period, ...

In 2019, automated test and airborne data loading technology is being disrupted by the introduction of never seen before technological concepts, including the world’s first cockpit control panel robot ...

NORTH READING, Mass., March 19, 2019 (GLOBE NEWSWIRE) -- Teradyne, Inc. (NASDAQ:TER), a leading supplier of automated test solutions, announced it has shipped its 4000th Eagle Test System, hitting a ...

Innovations in semiconductor technology—such as advancements in AI high-performance computing (HPC), Angstrom-scale silicon process nodes, silicon photonics, and automotive xEV wideband gap power ...

For over 35 years, Army weapon systems have relied on automatic test systems to diagnose and isolate platform failures. Two kinds of systems, at-platform automatic test systems (APATS) and ...