Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Wearable, mobile, implantable, and home health devices as well as electronic components, circuit boards, and subassemblies incorporated into medical equipment used in clinical settings all present ...

If your circuit design has requirements to be tolerant to certain faults and to report their occurrence, you’ll need to test the fault detection and protection features of your design during the test ...