ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

With the new Model Option Electric Motor, Vector has added a powerful function to the CANoe test environment since Release 19. Control units for electric motors (MCUs) can now be tested out-of-the-box ...