Atomic force microscopy (AFM) has emerged as a pivotal technique in biological research, offering unparalleled spatial resolution and force sensitivity to visualise and quantify the nanoscale ...

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Polymer materials play an increasingly important role in a variety of industrial applications, thanks to their distinct physical and chemical properties. Among their key mechanical characteristics, ...

Researchers have developed a new microscope that can visualize the optical response of surfaces at an unprecedented spatial resolution of one nanometer. This paves the way for optical microscopy of ...

Scattering near-field optical microscopy with ultralow tip oscillation amplitudes. Credit: Takashi Kumagai Understanding the interaction between light and matter at the smallest scales (angstrom scale ...

Understanding failure modes, mechanisms, and root causes is critical in the manufacturing of semiconductors and electronic devices. Identifying the underlying cause of a failure not only helps prevent ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...