Scientific Research Publishing

A Lightweight MobileViT with a Dual-Path Attention Mechanism for MRI Image Classification ()

Deep learning has been successfully applied in the field of medical diagnosis, and improving the accurate classification of ...
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...