4LS line scan image sensors operate at speeds up to 120,000 lines per second Independent lines of RGB + Clear sensor channels support full-color reproduction; digital TDI capability for excellent ...

Konstanz, Germany -- Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable ...

Teledyne DALSA has announced the launch of its new Tetra line scan camera family, designed for various machine vision applications. The Tetra series incorporates advanced multiline CMOS image sensor ...

Emergent Vision Technologies, a maker of high-speed GigE Vision cameras and vision technologies, introduces a new 100GigE line scan camera, the Pinnacle LZ-16KG5. Through its 100GigE QSFP28 interface, ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...

France’s New Imaging Technologies has launched a short-wave infrared line-by-line scanning camera for high-definition and high-performance silicon PV inspection systems. New Imaging Technologies (NIT) ...