Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...

At the Microscopy & Microanalysis 2008 Annual Meeting opening, Bruker AXS Microanalysis has introduced several new products and options for Scanning Electron Microscope (SEM) based materials analysis.

Within analytical sciences, energy dispersive X-ray spectroscopy (otherwise known as EDS) and CL in the scanning electron microscope (termed SEM) are vital microanalysis techniques. During the process ...

X-ray microanalysis is a powerful tool with high precision and speed, often revealing unexpected chemical phases, which cannot be detected by element-based image analysis alone as there are ...

CHN microanalysis is a key analytical technique for determining whether or not a sample is pure by providing a precise and accurate analysis of its percentage Carbon, Hydrogen and Nitrogen content and ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

Lehigh University materials science and engineering (MSE) professor Masashi Watanabe is the 2023 recipient of the Microanalysis Society Presidential Science Award, which recognizes a senior scientist ...

The ISS Group are pleased to announce the UK availability of the latest microanalysis technology from Thermo Scientific: the NORAN System SIX, the simplest instrument on the market to get ...

Christopher J. Kiely, the Harold B. Chambers Senior Professor of Materials Science and Engineering at Lehigh University’s P.C. Rossin College of Engineering and Applied Science, has been elected as a ...

Enhancements to the Noran System Six, Thermo Electron's X-ray microanalysis system, enable productivity gains in high-throughput microstructure characterization. Combined with a newly introduced 30-mm ...