Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

2008 promises to be an exciting year for the wireless industry, in particular because many multiple-input multiple-output (MIMO) devices will ramp into high-volume production, enabling increases in ...

Increased device complexity can be addressed by providing parallel test while decreasing the throughput overhead of the ATE architecture. The consumer world is converging, and the lines between ...

The complexity of electronic-device testing varies widely, ranging from the simplest type—manual testing—to the most complex—large-scale automatic test equipment (ATE). In between simple manual ...