Dual-frequency resonance tracking (DFRT) is a technique that utilizes contact mode atomic force microscopy (AFM) to measure a sample’s weak electrical or mechanical responses. Conventional resonance ...

Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

Quantitative characterization of nanomechanical properties has invariably been a holy grail for atomic force microscopy. This article explains some of the industry’s earlier attempts made at ...

In the event of a breakdown, any number of issues may be the culprit, but there’s one in particular that’s particularly challenging to diagnose: resonance. Resonance can be a problem in any machine, ...