TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...

Researchers have combined two microscopic imaging techniques in one microscope, providing scientists with a high-resolution method of tracking single molecules in a cellular context. The development ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

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They can image a wide range of materials and biological samples with high magnification, resolution, and depth of field, thereby revealing surface structure and chemical composition. Industries like ...

With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, the Goethe University in Frankfurt ...