Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

Scientists have pioneered a new methodology of fabricating carbon-based quantum materials at the atomic scale by integrating scanning probe microscopy techniques and deep neural networks. This ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...