Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

This webinar will cover three widely used high-resolution microscopy techniques that deliver nanoscale insights: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

Left: This is a simulated atomic force microscopy image. In this method, the tip of the microscope scans the surface of the sample (here: a single cobalt phthalocyanine (CoPC) molecule), measuring the ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...

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