This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

Electron microscopy (EM) has become an indispensable tool for investigating the nanoscale structure of a large range of materials, across physical and life sciences. It is vital for characterisation ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

The global transmission electron microscope market is rapidly expanding due to the increasing demand for analytical and structural characterization of nanostructured materials and is projected to ...

Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...