The vulnerability of PERC modules to LID and LeTID is well known and among the reasons the industry is moving towards N-type technology, which tends to be less affected by the two phenomena. TUV Nord ...

Are your environmental test results exposing true device weaknesses, or just reflecting extreme stress conditions?

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

STAr Technologies, a leader in parametric and reliability test systems today has launched STAr Pluto series tester to meet test needs for both Package- and Wafer-level reliability test systems. This ...

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...