The U.S. Department of Justice has filed a civil lawsuit against Connecticut-based Stanley Black & Decker, alleging the company failed to promptly report dangerous tool defects. According to the DOJ ...

Abstract: Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry.

This year’s Microsoft Digital Defense Report (MDDR) showcases the scale and sophistication of today’s cyber threats, the impact of emerging technologies on those threats, and the strategies that ...

The purpose of this plugin is to generate a csv-formated plain text file containing test results when running an NI TestStand sequence. The feature set is currently limited to handle most common step ...

A Columbia University public health instructor ranted to 400 incoming students about how the school’s prominent Jewish donors only made their gifts to “launder blood money” and denied the existence of ...