Identify sources of unnecessary cognitive load and apply strategies to focus on meaningful analysis and exploration.
The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction ...
Semiconductor manufacturer GlobalFoundries developed three practical AI-based solutions. The solutions assist with ...
The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
Devox, founded in 2018, may be the youngest here, but its 92% NPS and 5-star Clutch score tell a story. The firm blends ...
ABSTRACT: Agentic AI—software agents that plan, generate, test, and iterate across the software lifecycle—is bending the software cost curve. We merge two complementary analyses: 1) a ...
When internet services platform Cloudflare suffered an outage in November, it took a big chunk of the online world down with it. Major platforms like ChatGPT, X, and Canva became unreachable. So did ...
Recently, one of our clients stated that their web content accessibility guidelines (WCAG) were met, but users with disabilities were still unable to use their AI-native chatbot. When my team examined ...
When it comes to non-destructive testing (NDT), choosing the right defect recognition software for manufacturing is critical. When it comes to non-destructive testing (NDT), choosing the right defect ...
When it comes to non-destructive testing (NDT), choosing the right defect recognition software for manufacturing is critical to ensuring product quality, operational efficiency and compliance. With ...
Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Cory Benfield discusses the evolution of ...
This repository allows the replication of our study "Human-Written vs. AI-Generated Code: A Large-Scale Study of Defects, Vulnerabilities, and Complexity" accepted for publication at The 36th IEEE ...
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